Fraunhofer ISIT

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Quality and reliability in electronics

Advanced failure analysis forms the basis for quality, reliability and guaranteed function of electronic products in the product life cycle.

Defects caused by e.g. corrosion, incorrect component handling, thermal and mechanical stress of components to be processed are visualized using 3D X-ray inspection and target preparation as a means of cross-section analysis, among other things.

The root causes are always investigated and, together with the client, ways of improving delivery quality and production processes are shown, which ultimately forms the basis for reliable electronics.

Want to learn more and meet the experts in person?

» Visit Fraunhofer ISIT from 23 - 26 January 2024 at NORTEC!

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